TEM

Transmission electron microscopy (TEM) passes a high energy (200-300 keV) electron beam through a thinned section of the specimen to produce very high-resolution images of the material. The technique can be used to show structural, crystallographic and compositional information relating to very specific areas of the sample.

EELS

In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The energy loss can be measured via an electron spectrometer and is related to mass since the inner shell ionisations can be used to determine the elemental components of a material. The inner shell ionizations can be used to determine the elemental components of a material.

In combination TEM and EELS provide high resolution chemical images with distribution.